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Forfatter: Tonheim, Celin Russøy; Sudbø, Aasmund Sveinung; Selvig, Espen; Haakenaasen, Randi
Publisert: 2011
Emneord: Lysforsterkere; Optikk; Laser
Permalenke: http://hdl.handle.net/20.500.12242/783; https://ffi-publikasjoner.archive.knowledgearc.net/handle/20.500.12242/783
DOI: 10.1109/LPT.2010.2090517
Samling: Articles
Description: Tonheim, Celin Russøy; Sudbø, Aasmund Sveinung; Selvig, Espen; Haakenaasen, Randi. Enhancement in Light Emission From Hg-Cd-Te Due to Surface Patterning. IEEE Photonics Technology Letters 2011 ;Volum 23.(1) s. 36-38

828243.pdf: Size: 162k

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Enhancement of light emission from HgCdTe due to surface patterning has been studied by means of photoluminescence (PL) spectroscopy. A triangular pattern of circular holes was etched into the CdTe layer grown on top of HgCdTe thin-film and multiple quantum well samples. Two different pattern lattice constants were used, giving lattice constant aG to emission wavelength ratios of 0.9, 1.2, and 2.1. The surface pattern was found to give 26%-35% enhancement in measured PL intensity.

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dc.contributor.author	Tonheim, Celin Russøy ,Sudbø, Aasmund Sveinung ,Selvig, Espen ,Haakenaasen, Randi
dc.date.accessioned	2017-11-07T07:33:27Z ,2017-11-08T10:15:14Z
dc.date.available	2017-11-07T07:33:27Z ,2017-11-08T10:15:14Z
dc.date.issued	2011
dc.identifier.citation	Tonheim CR, Sudbø AS, Selvig E, Haakenaasen R. Enhancement in Light Emission From Hg-Cd-Te Due to Surface Patterning. IEEE Photonics Technology Letters. 2011;23(1):36-38
dc.identifier.uri	http://hdl.handle.net/20.500.12242/783 ,https://ffi-publikasjoner.archive.knowledgearc.net/handle/20.500.12242/783
dc.description	Tonheim, Celin Russøy; Sudbø, Aasmund Sveinung; Selvig, Espen; Haakenaasen, Randi. Enhancement in Light Emission From Hg-Cd-Te Due to Surface Patterning. IEEE Photonics Technology Letters 2011 ;Volum 23.(1) s. 36-38
dc.description.abstract	Enhancement of light emission from HgCdTe due to surface patterning has been studied by means of photoluminescence (PL) spectroscopy. A triangular pattern of circular holes was etched into the CdTe layer grown on top of HgCdTe thin-film and multiple quantum well samples. Two different pattern lattice constants were used, giving lattice constant aG to emission wavelength ratios of 0.9, 1.2, and 2.1. The surface pattern was found to give 26%-35% enhancement in measured PL intensity.
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dc.language.iso	en
dc.subject	TermSet Emneord::Lysforsterkere ,TermSet Emneord::Optikk ,TermSet Emneord::Laser
dc.title	Enhancement in Light Emission From Hg-Cd-Te Due to Surface Patterning
dc.type	Article
dc.date.updated	2017-11-07T07:33:27Z
dc.identifier.cristinID	828243 ,828243
dc.identifier.doi	10.1109/LPT.2010.2090517
dc.source.issn	1041-1135 ,1941-0174
dc.type.document	Journal article
dc.relation.journal	IEEE Photonics Technology Letters